A.H. Verbruggen | TU Delft Repository

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A.H. Verbruggen

Conference paper (20)

Journal article (20)

Report (2)

42 records found

1

Superconductor-insulator transition in nanowires and nanowire arrays

Journal article (2015) - J.E. Mooij (author), G Schön (author), A Shnirman (author), T Fuse (author), CJPM Harmans (author), H Rotzinger (author), A.H. Verbruggen (author)

Low gap superconducting single photon detectors for infrared sensitivity

Journal article (2011) - S.N. Dorenbos (author), P. Forn Diaz (author), T Fuse (author), A.H. Verbruggen (author), T Zijlstra (author), T.M. Klapwijk (author), T. M. Klapwijk (author), Val Zwiller (author), V. Zwiller (author), V.G. Zwiller (author)

Low-frequency noise in Josephson junctions for superconducting qubits

Journal article (2006) - JJ Eroms (author), LC van Schaarenburg (author), EFC Driessen (author), JH Plantenberg (author), CM Hulzinga (author), R.N. Schouten (author), Raymond N. Schouten (author), A.H. Verbruggen (author), C.J.P.M. Harmans (author), J.E. Mooij (author)

Resistance of superconducting nanowires connected to normal-metal leads

Journal article (2004) - GR Boogaard (author), A.H. Verbruggen (author), W Belzig (author), T. M. Klapwijk (author), T.M. Klapwijk (author)

High-temperature bulge-test setup for mechanical testing of free-standing thin films

Journal article (2003) - AJ Kalkman (author), A.H. Verbruggen (author), G.C.A.M. Janssen (author), GCAM Janssen (author)

Transient creep in free-standing thin polycrystalline aluminum films

Journal article (2002) - AJ Kalkman (author), A.H. Verbruggen (author), GCAM Janssen (author), G.C.A.M. Janssen (author), S Radelaar (author)

High-temperature tensile tests and activation volume measurement of free-standing submicron Al films

Journal article (2002) - AJ Kalkman (author), A.H. Verbruggen (author), S Radelaar (author)

The resistive transition of aluminium hot electron bolometer mixers with normal metal cooling banks

Conference paper (2002) - A.H. Verbruggen (author), T. M. Klapwijk (author), T.M. Klapwijk (author), W Belzig (author), JR Gao (author)

Young's modulus measurements and grain boundary sliding in free-standing thin metal films.

Journal article (2001) - AJ Kalkman (author), A.H. Verbruggen (author), G.C.A.M. Janssen (author), GCAM Janssen (author)

Deformation Mechanism in the Forcefill Process.

Journal article (2000) - G.C.A.M. Janssen (author), GCAM Janssen (author), JF Jongste (author), A.H. Verbruggen (author)

Localized stress near and the thermal expansion of AI 2 Cu precipitates in an AI thin film matrix.

Journal article (2000) - JP Lokker (author), N.M. van der Pers (author), A.H. Verbruggen (author), G.C.A.M. Janssen (author), GCAM Janssen (author), JF Jongste (author), S Radelaar (author)

Magnetoresistance fluctuations in short n-type Si/SiGe heterostructure wires.

Journal article (2000) - RG van Veen (author), A.H. Verbruggen (author), E.W.J.M. van der Drift (author), F Schaeffler (author), S Radelaar (author)

Plasma induced charging damage of gate oxides.

Conference paper (1999) - RG van Veen (author), A.H. Verbruggen (author), F Kuper (author), MSP Andriesse (author), E.W.J.M. van der Drift (author), S Radelaar (author), S Anders (author), HM Jaeger (author), Z Wang (author), P Tanner (author), C Salm (author), T Mouthaan (author)

An experimental study on magnetoresistance phenomena in n-type Si/SiGe quantum wires.

Journal article (1999) - RG van Veen (author), A.H. Verbruggen (author), E.W.J.M. van der Drift (author), F Schaffler (author), S Radelaar (author)

A novel bulge-testing set-up for tensile testing of micromachined rectangular free-standing thin films.

Journal article (1999) - AJ Kalkman (author), A.H. Verbruggen (author), GCAM Janssen (author), G.C.A.M. Janssen (author), FH Groen (author)

Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.

Conference paper (1999) - S Shingubara (author), Y Takeda (author), H Sakue (author), T Takahagi (author), A.H. Verbruggen (author)

Stress relaxation and creep in free-standing thin aluminium films studied using a bulge tester.

Conference paper (1999) - AJ Kalkman (author), A.H. Verbruggen (author), G.C.A.M. Janssen (author), GCAM Janssen (author)

A novel bulge-testing setup for rectangular free-standing thin flims.

Journal article (1999) - AJ Kalkman (author), A.H. Verbruggen (author), GCAM Janssen (author), G.C.A.M. Janssen (author), FH Groen (author)

Mechanism for forcefill.

Conference paper (1999) - GCAM Janssen (author), G.C.A.M. Janssen (author), A.H. Verbruggen (author), JF Jongste (author), S Radelaar (author)

Multiprobe resistance monitoring of Blech pattern during electromigration testing.

Conference paper (1999) - S Shingubara (author), T Osaka (author), H Sakaue (author), T Takahagi (author), A.H. Verbruggen (author)