High-temperature bulge-test setup for mechanical testing of free-standing thin films

Journal article (2003)

Authors

AJ Kalkman QN/Fysics of NanoElectronics
A.H. Verbruggen QN/Fysics of NanoElectronics
G.C.A.M. Janssen OLD Virtual Materials and Mechanics
Research Group
QN/Fysics of NanoElectronics
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Published Date

2003

Language

Undefined/Unknown

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Research Group

QN/Fysics of NanoElectronics