Transient creep in free-standing thin polycrystalline aluminum films

Kalkman, AJ; Verbruggen, A.H.; Janssen, G.C.A.M.; Radelaar, S

Transient creep in free-standing thin polycrystalline aluminum films

Journal article (2002)

Authors

AJ Kalkman QN/Fysics of NanoElectronics

A.H. Verbruggen QN/Fysics of NanoElectronics

G.C.A.M. Janssen OLD Metals Processing, Microstructures and Properties

S Radelaar OLD Metals Processing, Microstructures and Properties

Research Group

QN/Fysics of NanoElectronics

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Published Date

2002

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Research Group

QN/Fysics of NanoElectronics