TT

T Takahagi

2 records found

Authored

Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.
Conference paper (1999) - S Shingubara, Y Takeda, H Sakue, T Takahagi, A.H. Verbruggen

Multiprobe resistance monitoring of Blech pattern during electromigration testing.
Conference paper (1999) - S Shingubara, T Osaka, H Sakaue, T Takahagi, A.H. Verbruggen