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TT
T Takahagi
Academic Work (2)
Conference paper (2)
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2 records found
1
Multiprobe resistance monitoring of Blech pattern during electromigration testing.
Conference paper (1999) -
S Shingubara (author)
,
T Osaka (author)
,
H Sakaue (author)
,
T Takahagi (author)
,
A.H. Verbruggen (author)
Electromigration eliability study of a GMR spin valve device, Materials Reliability in Microelectronics IX.
Conference paper (1999) -
S Shingubara (author)
,
Y Takeda (author)
,
H Sakue (author)
,
T Takahagi (author)
,
A.H. Verbruggen (author)
