Young's modulus measurements and grain boundary sliding in free-standing thin metal films.

Journal article (2001)

Authors

AJ Kalkman QN/Fysics of NanoElectronics
A.H. Verbruggen QN/Fysics of NanoElectronics
G.C.A.M. Janssen OLD Metals Processing, Microstructures and Properties
Research Group
QN/Fysics of NanoElectronics
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Published Date

2001

Language

Undefined/Unknown

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Research Group

QN/Fysics of NanoElectronics