Stress relaxation and creep in free-standing thin aluminium films studied using a bulge tester.

Kalkman, AJ; Verbruggen, A.H.; Janssen, G.C.A.M.

Stress relaxation and creep in free-standing thin aluminium films studied using a bulge tester.

Conference paper (1999)

Authors

AJ Kalkman QN/Fysics of NanoElectronics

A.H. Verbruggen QN/Fysics of NanoElectronics

G.C.A.M. Janssen OLD Metals Processing, Microstructures and Properties

Research Group

QN/Fysics of NanoElectronics

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Published Date

1999

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Research Group

QN/Fysics of NanoElectronics