A novel bulge-testing setup for rectangular free-standing thin flims.

Journal article (1999)

Authors

AJ Kalkman QN/Fysics of NanoElectronics
A.H. Verbruggen QN/Fysics of NanoElectronics
G.C.A.M. Janssen OLD Metals Processing, Microstructures and Properties
FH Groen ImPhys/Optics - AS
Research Group
QN/Fysics of NanoElectronics
More Info
expand_more

Published Date

1999

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

QN/Fysics of NanoElectronics