Position controlled nanowires for infrared single photon emission

An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

Single-Grain Si TFTs for flexible electronics and 3D-ICs

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

Single grain Si TFTs and local electrical properties of CSL boundaries

Single-grain Si thin film transistors SPICE model, analog and RF circuit applications

High Performance Single Grain Si TFTs Inside a Location-Controlled Grain by Micro-Czochralski Process with Capping Layer

Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

Ingle-Grain Si TFTs and Circuits for Flexible Electronics and 3D-ICs

Analog and RF design using the mu-Czochralski single grain TFT technology

DC modeling of Single-Grain Si TFTs using BSIMSOI

Microstructure characterization of location-controlled Si-islands crystallized by excimer laser in the mu-Czochralski (grain filter) process

SPICE modeling of single-grain Si TFTs using BSIMSOI

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope

SPICE modeling of single-grain Si TFTs using TFTs BSIMSOI

Single-grain Si TFTs and circuits fabricated through advanced excimer-laser crystallization

Automated digital circuits design based on single-grain si TFTs fabricated through u-Czochralski (grain filter) process

Influences of the capping layer on the grain growth with micro-Czochralski process during excimer-laser crystallization

Capping layer on thin Si film for ¿-Czochralski process with excimer laser crystallization

Effects of capping layer on grain growth with ¿-Czochralski process during excimer laser crystallization