8 records found
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Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy
Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy
Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy
Single grain Si TFTs and local electrical properties of CSL boundaries
Single-Grain Si TFTs for flexible electronics and 3D-ICs
Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy
Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope
Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy