N Matsuki | TU Delft Repository

N

N Matsuki

Conference paper (6)

Journal article (2)

8 records found

1

Direct observation of the electrical activity of coincidence-site lattice boundaries in location-controlled silicon islands using scanning spread resistance microscopy

Journal article (2009) - N Matsuki (author), R. Ishihara (author), C.I.M. Beenakker (author)

Single grain Si TFTs and local electrical properties of CSL boundaries

Conference paper (2008) - R. Ishihara (author), N Matsuki (author), T Chen (author), D Danciu (author), V Rana (author), Y Hiroshima (author), S Inoue (author)

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

Conference paper (2008) - N Matsuki (author), R. Ishihara (author), A Baiano (author), Y Hiroshima (author), S Inoue (author), C.I.M. Beenakker (author)

Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy

Journal article (2008) - N Matsuki (author), R. Ishihara (author), A Baiano (author), C.I.M. Beenakker (author)

Single-Grain Si TFTs for flexible electronics and 3D-ICs

Conference paper (2008) - R. Ishihara (author), A Baiano (author), N Karak (author), S Inoue (author), C.I.M. Beenakker (author), N. Saputra (author), M.M. Danesh (author), N Matsuki (author), T Chen (author), V Rana (author), M He (author), J..R.. Long (author), Y Hiroshima (author)

Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

Conference paper (2007) - N Matsuki (author), R. Ishihara (author), A Baiano (author), Y Hiroshima (author), S Inoue (author), C.I.M. Beenakker (author)

Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

Conference paper (2007) - N Matsuki (author), R. Ishihara (author), T Chen (author), Y Hiroshima (author), JW Metselaar (author), C.I.M. Beenakker (author)

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope

Conference paper (2007) - N Matsuki (author), R. Ishihara (author), A Baiano (author), Y Hiroshima (author), S Inoue (author), C.I.M. Beenakker (author)