Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

Matsuki, N; Ishihara, Ryoichi; Chen, T; Hiroshima, Y; Metselaar, JW; Beenakker, C.I.M.

Local electrical properties of coincidence site lattice boundaries in location-controlled silicon islands by scanning capacitance microscopy

Conference paper (2007)

Authors

N Matsuki Electronic Components, Technology and Materials

Ryoichi Ishihara Electronic Components, Technology and Materials

T Chen Old - EWI Sect. ECTM

Y Hiroshima External organisation

JW Metselaar Electronic Components, Technology and Materials

C.I.M. Beenakker Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

Elektrotechniek Techniek

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Published Date

2007

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Research Group

Electronic Components, Technology and Materials

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