Single grain Si TFTs and local electrical properties of CSL boundaries

Ishihara, R; Matsuki, N; Chen, T; Danciu, D; Rana, V; Hiroshima, Y; Inoue, S

Single grain Si TFTs and local electrical properties of CSL boundaries

Conference paper (2008)

Authors

R Ishihara Electronic Components, Technology and Materials

N Matsuki Electronic Components, Technology and Materials

T Chen Old - EWI Sect. ECTM

D Danciu Electronic Components, Technology and Materials

V Rana Electronic Components, Technology and Materials

Y Hiroshima External organisation

S Inoue External organisation

Research Group

Electronic Components, Technology and Materials

Elektrotechniek Techniek

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Published Date

2008

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Research Group

Electronic Components, Technology and Materials

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