Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

Matsuki, N; Ishihara, R.; Baiano, A; Hiroshima, Y; Inoue, S; Beenakker, C.I.M.

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

Conference paper (2008)

Authors

N Matsuki Electronic Components, Technology and Materials -

R. Ishihara Electronic Components, Technology and Materials -

A Baiano Electronic Components, Technology and Materials -

Y Hiroshima External organisation

S Inoue External organisation

C.I.M. Beenakker Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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Published Date

2008

Language

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials