Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

Matsuki, N; Ishihara, R; Baiano, A; Hiroshima, Y; Inoue, S; Beenakker, C. W J

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

Conference paper (2008)

Authors

N Matsuki Electronic Components, Technology and Materials

R Ishihara Electronic Components, Technology and Materials

A Baiano Electronic Components, Technology and Materials

Y Hiroshima External organisation

S Inoue External organisation

C. W J Beenakker Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2008

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Research Group

Electronic Components, Technology and Materials

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