A

A Baiano

31 records found

Authored

High Performance n- and p-channel Strained Single Grain Silicon TFTs using Excimer Laser
Conference paper (2009) - A Baiano, R. Ishihara, C.I.M. Beenakker

Stacking of Single-Grain Thin-Film Transistors

Formation of location-controlled germanium grains by excimer laser

Germanium grains location control using ¿-czochralski process

2D simulation of hot-carrier-induced degradation and reliability analysis for single grain Si TFTs
Conference paper (2008) - J. Tan, A Baiano, R. Ishihara, C.I.M. Beenakker

An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

Single-Grain Si TFTs for flexible electronics and 3D-ICs

Reliability analysis of single grain Si TFT using 2D simulation
Conference paper (2008) - A Baiano, J. Tan, R. Ishihara, C.I.M. Beenakker

Monolithic 3D integration of single-grain Si TFTs

Investigation of local electrical properties of coincidence-site-lattice boundaries in location-controlled silicon islands using scanning capacitance microscopy
Journal article (2008) - N Matsuki, R. Ishihara, A Baiano, C.I.M. Beenakker

A flexible active-matrix electronic paper with integrated display driver using the u-Czochralski single grain TFT technology

Single-grain Si thin film transistors SPICE model, analog and RF circuit applications

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscopy

SPICE modeling of single-grain Si TFTs using TFTs BSIMSOI

SPICE modeling of single-grain Si TFTs using BSIMSOI

Single-grain Si thin-film transistors for analog and RF circuit applications
Conference paper (2007) - N. Saputra, M.M. Danesh, A Baiano, R. Ishihara, J..R.. Long

DC modeling of Single-Grain Si TFTs using BSIMSOI

Analog and RF design using the mu-Czochralski single grain TFT technology

Local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning spread resistance microscopy

Characterization of local electrical property of coincidence site lattice boundary in location-controlled silicon islands by scanning probe microscope