2D simulation of hot-carrier-induced degradation and reliability analysis for single grain Si TFTs

Conference paper (2008)

Authors

J. Tan Electronic Instrumentation
A Baiano Electronic Components, Technology and Materials
R. Ishihara Electronic Components, Technology and Materials
C. W J Beenakker Electronic Components, Technology and Materials
Research Group
Electronic Instrumentation
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Published Date

2008

Language

Undefined/Unknown

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Research Group

Electronic Instrumentation

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