An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

Saputra, N.; Danesh, M.M.; Baiano, A; Ishihara, R.; Long, J..R..; Karaki, N; Inoue, S

An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

Journal article (2008)

Authors

N. Saputra Electronics

M.M. Danesh Electronics

A Baiano Electronic Components, Technology and Materials

R. Ishihara Electronic Components, Technology and Materials

J..R.. Long Electronics

N Karaki External organisation

S Inoue External organisation

Research Group

Electronics

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Published Date

2008

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Research Group

Electronics

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