N

N Nenadovic

42 records found

Assessment of Line Energization Transients when Increasing Cable Length in 380 kV Power Grids
Integration of long EHV XLPE underground cables in traditionally OHL-based transmission systems can result in abnormal transients caused by large cable shunt capacitance. Transients associated with switching of long cables may result in severe temporary or transient overvoltages. ...

Restabilizing mechanisms after the onset of thermal instability in bipolar transistors

MEMS test structure for measuring thermal conductivity of thin films

Thermally induced current bifurcation in bipolar transistors

PVD Aluminium Nitride as Heat Spreader in Silicon-On-Glass Technology

Offset voltage of Schottky-collector silicon-on-glass vertical PNP's

PVD aluminium nitride as heat-spreader in IC technology

Electrothermal stability of bipolar transistors at medium and high-current operation regimes

Reactive sputter deposition of aluminium nitride thin films as heat spreaders in IC processes

Electrothermal characterization of silicon-on-glass VDMOSFETs
Electrothermal consequences of implementing bulk-silicon RF power MOS processes in the silicon-on-glass substrate transfer technology are investigated in this paper. Fabricated silicon-on-glass vertical double-diffused MOSFETs are measured on-wafer and very large thermal resistan ...

Analytical modeling and numerical simulations of the offset voltage in silicon-on-glass vertical PNP's

FEAT - a simulation tool for electrothermal analysis of multifinger bipolar transistors

Electrothermal limitations on the current density of high-frequency bipolar transistors

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

A novel SPICE macromodel of BTJs including the temperature dependence of high-injection effects

Electrothermal behavior of high-frequency silicon-on-glass transistors
Doctoral thesis (2004) - N Nenadovic (author)

Electrothermal limitations on the current density of high-frequency bipolar transistors

Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors

A back-wafer contacted silicon-on-glass integrated bipolar process - Part I: the conflict electrical versus thermal isolation

The electro-thermal smoothie database model for LDMOS devices