5 records found
1
Parallel scanning probe microscope comes of age
Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems
Parallel, miniaturized scanning probe microscope for defect inspection and review
Fabrication and analysis of Exteme Ultra-violet reflection masks with patterned W/C absorber bilayers
Extreme UV Lithography: Development of a laser plasma source and multilayer reflective optics