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RH
RW Herfst
Academic Work (4)
Abstract (1)
Conference paper (2)
Journal article (1)
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4 records found
1
Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems
Journal article (2014) -
RW Herfst (author)
,
W Klop (author)
,
M Eschen (author)
,
TC van den Dool (author)
,
NB Koster (author)
,
H. Sadeghian Marnani (author)
Parallel scanning probe microscope comes of age
Abstract (2014) -
H. Sadeghian Marnani (author)
,
TC van den Dool (author)
,
W.E. Crowcombe (author)
,
RW Herfst (author)
,
J Winters (author)
,
GFIJ Kramer (author)
,
NB Koster (author)
High-throughput parallel SPM for metrology, defect, and mask inspection
Conference paper (2014) -
H. Sadeghian Marnani (author)
,
RW Herfst (author)
,
TC van den Dool (author)
,
W.E. Crowcombe (author)
,
J Winters (author)
,
GFIJ Kramer (author)
Parallel, miniaturized scanning probe microscope for defect inspection and review
Conference paper (2014) -
H. Sadeghian Marnani (author)
,
TC van den Dool (author)
,
W.E. Crowcombe (author)
,
RW Herfst (author)
,
J Winters (author)
,
GFIJ Kramer (author)
,
NB Koster (author)