Characterisation of multilayers by X-ray reflection

Scattering from thin layers and interfaces

Epitaxial film growth of the charge-density-wave conductor Rb0.3MoO3 on SrTi03 (001)

Orientation of the charge-density-wave chains in thin films of Rb0.30MoO3

Orietation of the charge-density-wave chains in thin films of Rb 0.30 MoO 3

Thin films of the charge density wave oxide Rb 0.30 MoO 3, pulsed laser deposition

Report on de X-ray data of SION material

New application of classical x-ray diffraction methods for epitaxial film characterization

Strain structures in nanoscale germanium hut clusters on Si(001) studied by X-ray diffraction

Characterization of single-crystalline Al films grown on Si(111)

The internal strain structure of Ge hut clusters on Si(001), studied by X-ray diffraction