New application of classical x-ray diffraction methods for epitaxial film characterization

Peterse, WJAM; Scholte, PMLO; Steinfort, AJ; Tuinstra, F.

New application of classical x-ray diffraction methods for epitaxial film characterization

Journal article (1996)

Authors

WJAM Peterse External organisation

PMLO Scholte Old organisation TN/TechnischeNatuurkunde voorm

AJ Steinfort Old organisation TN/TechnischeNatuurkunde voorm

F. Tuinstra Old - sect Physics Education (TN/WNO)

Department

Old organisation TN/TechnischeNatuurkunde voorm

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Published Date

1996

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Department

Old organisation TN/TechnischeNatuurkunde voorm