P

PMLO Scholte

24 records found

Authored

Characterization and control of piezo driven scanning probe translation mechanisms

NEXT: an experimental effort towards nanoelectronic devices

Growth pyramids on Si(111) facets: a CVD and MBE study

Design and construction of a high resolution 3D translation stage for metrological applications

Characterisation of multilayers by X-ray reflection
Journal article (1998) - AJ Steinfort, PMLO Scholte, F. Tuinstra

Epitaxial film growth of the charge-density-wave conductor Rb0.3MoO3 on SrTi03 (001)

Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes

Nucleation of homoepitaxial Si chains on Si(001) at room temperature
Journal article (1997) - J van Wingerden, MJ Haye, PMLO Scholte, F. Tuinstra

Sodium doped dimer rows on Si(001)

Room temperature growth of submonolayers of silicon on Si(001) studied with STM

Sodim-doped dimer rows on SI(001)

Atomic details of step flow growth on Si(001)

Control considerations for a Scanning Tunneling Microscope

Origin of rippled structures formed during growth of Si on Si(001) with MBE

Interactions between adsorbed Si dimers on Si(001)

A calibrated scanning tunneling microscope equipped with capacitive sensors
Journal article (1996) - AE Holman, CD Laman, PMLO Scholte, WC Heerens, F. Tuinstra

AFM study of (100) SrTiO3 substrates used to grow high-Tc-superconductor thin films

Strain structures in nanoscale germanium hut clusters on Si(001) studied by X-ray diffraction

New application of classical x-ray diffraction methods for epitaxial film characterization
Journal article (1996) - WJAM Peterse, PMLO Scholte, AJ Steinfort, F. Tuinstra

The internal strain structure of Ge hut clusters on Si(001), studied by X-ray diffraction