State-space analysis and identification for a class of hysteretic systems.

Observation of zero creep in piezoelectric actuators

Electro-optic transfer function measurements using an ultra fast ellipsometer.

Characterization and control of piezo driven scanning probe translation mechanisms

Design and construction of a high resolution 3D translation stage for metrological applications

Characterisation and control of piezo driven scanning probe translation mechanisms

Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster.

Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes

Control considerations for a Scanning Tunneling Microscope