Characterisation of multilayers by X-ray reflection

Steinfort, AJ; Scholte, PMLO; Tuinstra, F.

Characterisation of multilayers by X-ray reflection

Journal article (1998)

Authors

AJ Steinfort Old organisation TN/TechnischeNatuurkunde voorm

PMLO Scholte Old organisation TN/TechnischeNatuurkunde voorm

F. Tuinstra Old - sect Physics Education (TN/WNO)

Department

Old organisation TN/TechnischeNatuurkunde voorm

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Published Date

1998

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Department

Old organisation TN/TechnischeNatuurkunde voorm

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