Methods for optical modeling and cross-checking in ellipsometry and scatterometry

Conference paper (2015)

Authors

P. Petrik ImPhys/Optics - AS
B Fodor External organisation
T Lohner External organisation
Paul Urbach ImPhys/Optics - AS
B Bodermann External organisation
M Fried External organisation
E Agocs External organisation
P Kozma External organisation
J Nador External organisation
N. Kumar ImPhys/Optics - AS
J Endres External organisation
G Juhasz External organisation
C Major External organisation
S.F. Pereira ImPhys/Optics - AS
Research Group
ImPhys/Optics (AS) (TU Delft)
More Info
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Published Date

2015

Language

English

Reuse Rights

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Faculty

Applied Sciences

Department

ImPhys/Imaging Physics

Research Group

ImPhys/Optics