H Kukner | TU Delft Repository

HK

H Kukner

Conference paper (7)

Journal article (1)

8 records found

1

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier

Conference paper (2015) - I.O. Agbo (author), M. Taouil (author), S. Hamdioui (author), H Kukner (author), P Weckx (author), P Raghavan (author), Francky Catthoor (author)

Bias temperature instability analysis of FinFET based SRAM cells

Conference paper (2014) - M.S.K. Seyab (author), I.O. Agbo (author), S. Hamdioui (author), H Kukner (author), B Kaczer (author), P Raghavan (author), Francky Catthoor (author)

Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

Journal article (2014) - H Kukner (author), F. Khan (author), P Weckx (author), P Raghavan (author), S. Hamdioui (author), B Kaczer (author), Francky Catthoor (author), L van der Perre (author), R Lauwereins (author), G Groeseneken (author)

Bias temperature instability analysis in SRAM decoder

Conference paper (2013) - M.S.K. Seyab (author), S. Hamdioui (author), H Kukner (author), P Raghavan (author), Francky Catthoor (author)

Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis

Conference paper (2012) - M.S.K. Seyab (author), S. Hamdioui (author), H Kukner (author), P Raghavan (author), Francky Catthoor (author)

BTI Impacts on logical gates in nano-scale CMOS technology

Conference paper (2012) - M.S.K. Seyab (author), S. Hamdioui (author), H Kukner (author), Francky Catthoor (author), P Raghavan (author)

Impact of partial resistive defects and bias temperature instability on SRAM decoder reliablity

Conference paper (2012) - M.S.K. Seyab (author), S. Hamdioui (author), M. Taouil (author), H Kukner (author), P Raghavan (author), Francky Catthoor (author)

Optimizing Memory BIST Address Generator Implementations

Conference paper (2011) - A.J. van de Goor (author), H Kukner (author), S. Hamdioui (author)