Bias temperature instability analysis of FinFET based SRAM cells

Conference paper (2014)

Authors

M.S.K. Seyab Computer Engineering - EEMCS
I.O. Agbo Computer Engineering - EEMCS
S. Hamdioui Computer Engineering - EEMCS
H Kukner External organisation
B Kaczer External organisation
Praveen Raghavan External organisation
Francky Catthoor External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2014

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering