MS

M.S.K. Seyab

18 records found

Authored

Bias temperature instability analysis of FinFET based SRAM cells

Variability and reliability analyses in SRAM decoder
Conference paper (2013) - M.S.K. Seyab, S. Hamdioui

Bias temperature instability analysis, monitoring and mitigation for nano-scaled circuits
Doctoral thesis (2013) - M.S.K. Seyab

Bias temperature instability analysis in SRAM decoder

Comparative BTI analysis in nano-scale circuits lifetime
Conference paper (2012) - M.S.K. Seyab, S. Hamdioui, Francky Catthoor

Analyzing combined impacts of parameter variations and BTI in nano-scale logical gates
Conference paper (2012) - M.S.K. Seyab, S. Hamdioui

Impact of partial resistive defects and bias temperature instability on SRAM decoder reliablity

BTI Impacts on logical gates in nano-scale CMOS technology

Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis

Modeling and Mitigating NBTI in Nanoscale Circuits
Conference paper (2011) - M.S.K. Seyab, S. Hamdioui

NBTI Monitoring and Design for Reliability in Nanoscale Circuits
Conference paper (2011) - M.S.K. Seyab, N.Z.B. Haron, S. Hamdioui, Francky Catthoor

ReverseAge: an Online NBTI Combating Technique Using Time Borrowing
Conference paper (2011) - M.S.K. Seyab, S. Hamdioui

NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation
Conference paper (2011) - M.S.K. Seyab, S. Hamdioui

Temperature dependence of NBTI induced delay
Conference paper (2010) - M.S.K. Seyab, S. Hamdioui

Trends and challenges of SRAM reliability in the nano-scale era
Conference paper (2010) - M.S.K. Seyab, S. Hamdioui

NBTI modeling in the framework of temperature variation
Conference paper (2010) - M.S.K. Seyab, S. Hamdioui

Temperature impact on NBTI modeling in the framework of technology scaling
Conference paper (2010) - M.S.K. Seyab, S. Hamdioui

CMOS scaling impacts on reliability, what do we understand?
Conference paper (2008) - M.S.K. Seyab, N.Z.B. Haron, S. Hamdioui