NH

N.Z.B. Haron

19 records found

Testing open defects in memristor-based memories

Testability and fault tolerance for emerging nanoelectronic memories
Doctoral thesis (2012) - N.Z.B. Haron (author)

DfT schemes for resistive open defects in RRAMs

NBTI Monitoring and Design for Reliability in Nanoscale Circuits

Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories

On Defect Oriented Testing for Hybrid CMOS/memristor Memory

Cost-Efficient Fault-Tolerant Decoder for Hybrid Nanoelectronic Memories

On Correcting Cluster Errors in Nanoelectronic Memories

High-performance cluster-fault tolerance scheme for hybrid nanoelectronic memories

ECC design for fault-tolerant crossbar memories: a case study

Redundant residue number system code for fault-tolerant hybrid memories

Mitigating defective CMOS to non-CMOS vias in CMOS/molecular memories

Emerging non-CMOS nanoelectronic devices-What are they?

Using RRNS codes for cluster faults tolerance in hybrid memories

Fault tolerance architecture for reliable hybrid CMOS/nanodevices memory

Residue-based code for reliable hybrid memories

CMOS scaling impacts on reliability, what do we understand?

Why is CMOS scaling coming to an END?

Emerging crossbar-based hybrid nanoarchitectures for future computing systems