Bias temperature instability analysis, monitoring and mitigation for nano-scaled circuits

Doctoral thesis (2013)

Authors

M.S.K. Seyab Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2013

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering