A.J. van de Goor
9 records found
1
Authored
March U
A test for unlinked memory faults
Short and efficient memory tests is the goal of every test designer. To reduce the cost of production tests, often a simple test which covers most of the faults, e.g. all simple (unlinked) faults, is desirable to eliminate most defective parts; a more costly test can be used t ...
March LA
A test for linked memory faults
A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.
@enMarch LR
A test for realistic linked faults
Many march tests have already been designed to cover faults of different fault models. The complexity of these tests arises when linked faults are taken into consideration. This paper gives an overview of the most important and commonly used fault models, including the industr ...
The problem of designing memory tests ts to establish a relevant set of fault models only consisting of those faults which are shown to be possible to occur in practice. Thereafter, it is a challenge to the test designer to design an optimum test covering the faults of the est ...