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A test for linked memory faults

Journal article (1997)

Authors

A.J. van de Goor Computer Engineering
G. N. Gaydadjiev Computer Engineering
Research Group
Computer Engineering
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Published Date

1997

Language

English

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Research Group

Computer Engineering

Abstract

A test is presented for detecting simple memory faults as well as linked memory faults. It assumes the multiple linked faults as a set of involved simple faults and guarantees their detection by detecting the simple faults belonging to the set.

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