Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

Journal article (2014)

Authors

H Kukner External organisation
F. Khan Computer Engineering - EEMCS
P Weckx External organisation
P Raghavan External organisation
S. Hamdioui Computer Engineering - EEMCS
B Kaczer External organisation
Francky Catthoor External organisation
L van der Perre External organisation
R Lauwereins External organisation
G Groeseneken External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2014

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering