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R Lauwereins
1 records found
1
Authored
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
Journal article (2014) -
H Kukner
,
F. Khan
,
P Weckx
,
P Raghavan
,
S. Hamdioui
,
B Kaczer
,
Francky Catthoor
,
L van der Perre
,
R Lauwereins
,
G Groeseneken
