ZJ

ZX Jiang

18 records found

Authored

Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry.

Complex roughening of Si under oblique bombardment by low-energy oxygen ions.
Journal article (2000) - P.F.A. Alkemade, ZX Jiang

Apparent depths of B and Ge deltas in Si as measured by secondary ion mass spectrometry.
Journal article (2000) - ZX Jiang, P.F.A. Alkemade, CH Tung, JLF Wang

The surface transient in Si for SIMS with oblique low-energy o2+ beams.
Journal article (1999) - ZX Jiang, P.F.A. Alkemade

Anomalous surface transient of boron in Si.
Conference paper (1999) - P.F.A. Alkemade, ZX Jiang

Depth profile analysis of Si with low-energy and oblique O2+ beams.
Conference paper (1999) - ZX Jiang, P.F.A. Alkemade, JLF Wang

The complex formation of ripples during depth profiling of Si with low energy, grazing oxygen beams
Journal article (1998) - ZX Jiang, P.F.A. Alkemade

Depth resolution for Ge in Si with low energy and grazing O2+ beams

Secondary ion mass spectrometry and atomic force spectroscopy studies of surface roughening, erosion rate change and depth resolurion in Si during 1 keV 60 degrees O2+ bombardment with oxygen flooding
Journal article (1998) - ZX Jiang, P.F.A. Alkemade

Erosion rate change and surface roughening in Si during oblique O2+ bombardment with oxygen flooding
Conference paper (1998) - ZX Jiang, P.F.A. Alkemade

Ultra-high depth resolution analysis with a magnetic-sector SIMS
Journal article (1998) - ZX Jiang, P.F.A. Alkemade

Ultra-high depth resolution with a grazing sub-keV oxygen beam in a magnetic sector SIMS

Ultra-high depth resolution RBS and SIMS of the modification of a Ge delta in Si during 2 keV O2+ sputtering
Journal article (1998) - WM Arnoldbik, ZX Jiang, P.F.A. Alkemade, DJ Boerma

SIMS Meting aan SiGe (B) multilaag
Report (1998) - ZX Jiang, P.F.A. Alkemade

High depth resolution SIMS analysis with low-energy grazing O2+ beams
Journal article (1997) - ZX Jiang, E Algra, P.F.A. Alkemade, S Radelaar

A noval approach for the determination of the actual incidence angle in a magnetic-sector SIMS instrument
Journal article (1997) - ZX Jiang, P.F.A. Alkemade

Ultra-high depth resolution SIMS with sub-kev grazing O2+ beams

Ionization probability of secondary Cs under Cs+ bombardment
Conference paper (1996) - ZX Jiang, LZ Cha, YX Wang, HC Chen, X Cheng