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T Mouthaan
Academic Work (1)
Conference paper (1)
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Plasma induced charging damage of gate oxides.
Conference paper (1999) -
RG van Veen (author)
,
A.H. Verbruggen (author)
,
F Kuper (author)
,
MSP Andriesse (author)
,
E.W.J.M. van der Drift (author)
,
S Radelaar (author)
,
S Anders (author)
,
HM Jaeger (author)
,
Z Wang (author)
,
P Tanner (author)
,
C Salm (author)
,
T Mouthaan (author)