Person | TU Delft Repository

CS

C Salm

2 records found

1

Authored

Low-frequency noise phenomena in switched MOSFETs

Journal article (2007) - MF Snoeij, AP van der wel, EAM Klumperink, JS Kolhatkar, E Hoekstra, C Salm, H Wallinga, B. Nauta

Plasma induced charging damage of gate oxides.

Conference paper (1999) - RG van Veen, A.H. Verbruggen, F Kuper, MSP Andriesse, E.W.J.M. van der Drift, S Radelaar, S Anders, HM Jaeger, Z Wang, P Tanner, C Salm, T Mouthaan