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FK
F Kuper
1 records found
1
Authored
Plasma induced charging damage of gate oxides.
Conference paper (1999) -
RG van Veen
,
A.H. Verbruggen
,
F Kuper
,
MSP Andriesse
,
E.W.J.M. van der Drift
,
S Radelaar
,
S Anders
,
HM Jaeger
,
Z Wang
,
P Tanner
,
C Salm
,
T Mouthaan
