Td

Th.H de Keijser

21 records found

Diffraction-line Broadening analysis of Strain Fields in Crystalline Solids.

New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

On the origin of stress in magnetron sputtered TiN layers.

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

Diffraction-line Broadening Analysis of Dislocation Configurations.

Relaxation of internal stresses in chemically vapour deposited TiN/TiB2 double layers.

A model for stress in thin layers induced by misfitting particles. An origin for growth stress.

Stress and stress gradients in magnetron sputtered TiN layers.

Highly supersaturated, highly sputtered Ag-Co and Ag-Ni layers.

Note on relaxation of cooling induced strains in two-phase AlSi-alloys at room temperature

Precipitation in liquid-quenched Al-Mg alloys; a study by use of X-ray diffraction line shift and line broadening

On misfit-induced lattice spacing variations in two-phase-alloys: the case of cooling-induced microstrains in the Al-matrix of fully aged AlSi alloys

Kinetics of precipitation and of relaxation of precipitation-induced stresses in aluminium-silicon alloys

Misfit strains and excess vacancies in liquid-quenched and solid-quenched AlSi alloys on aging

Excess vacancies in rapidly quenched aluminium alloys

Consolidation and resulting tensile strength of melt-spun AlMg and AlSi alloys

Rapidly solidified (melt-spun) aluminium alloys: morphology, texture and excess vacancies

On precipitation in rapidly solidified aluminium-silicon alloys

Structural inhomogenaties of AlSi alloys rapidly quenched from the melt