A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

Kamminga, J.; Delhez, R.; de Keijser, Th.H; Mittemeijer, EJ

A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

Journal article (2000)

Authors

J. Kamminga OLD Metals Processing, Microstructures and Properties

R. Delhez OLD Virtual Materials and Mechanics

Th.H de Keijser External organisation

EJ Mittemeijer OLD Virtual Materials and Mechanics

Research Group

OLD Metals Processing, Microstructures and Properties

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Published Date

2000

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Research Group

OLD Metals Processing, Microstructures and Properties