RD

R. Delhez

View Orcid Profile
View Pure Profile

50 records found

Authored

A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.
Journal article (2000) - J. Kamminga, R. Delhez, Th.H de Keijser, EJ Mittemeijer

New methods for diffraction stress measurement: a critical evaluation of new and existing methods.
Journal article (2000) - J. Kamminga, Th.H de Keijser, EJ Mittemeijer, R. Delhez

On the origin of stress in magnetron sputtered TiN layers.
Journal article (2000) - J. Kamminga, Th.H de Keijser, R. Delhez, EJ Mittemeijer

Relation between macro- and microstress in thin metallic layers.
Conference paper (2000) - LJ Seijbel, R. Delhez

Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations.
Journal article (2000) - J. Kamminga, R. Delhez

Analysis of the State of Stress in Precipitating Alloy Films. Precipation of Ti in Mo-Ti Films.
Journal article (2000) - L Velterop, RD Xia, R. Delhez, EJ Mittemeijer

X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.

Diffraction-line Broadening analysis of Strain Fields in Crystalline Solids.

Applications of Line Broadening.
Journal article (1999) - D Balzar, R. Delhez

Diffraction-line Broadening Analysis of Dislocation Configurations.

Macro- and microstrain relaxation in annealed Ag films during ageing at room temperature.
Conference paper (1998) - RC Currie, R. Delhez, EJ Mittemeijer

A method to determine the volume fraction of a separate component in a diffracting volume.
Journal article (1998) - TC Bor, MC Huisman, R. Delhez, EJ Mittemeijer

Simulation of X-ray diffraction-line broadening for a material containing misfitting precipitates
Journal article (1998) - TC Bor, R. Delhez, E van der Giessen, EJ Mittemeijer

Highly supersaturated, highly sputtered Ag-Co and Ag-Ni layers.

Stress and stress gradients in magnetron sputtered TiN layers.
Conference paper (1998) - J. Kamminga, R. Delhez, Th.H de Keijser, EJ Mittemeijer

A model for stress in thin layers induced by misfitting particles. An origin for growth stress.
Journal article (1998) - J. Kamminga, Th.H de Keijser, R. Delhez, EJ Mittemeijer

Relaxation of internal stresses in chemically vapour deposited TiN/TiB2 double layers.

Strain fields in precipitating alloys: modelling of deffraction-line profile shift and broadening.
Conference paper (1998) - TC Bor, R. Delhez, EJ Mittemeijer, E van der Giessen

Note on relaxation of cooling induced strains in two-phase AlSi-alloys at room temperature

Structural inhomogenaties of AlSi alloys rapidly quenched from the melt