L

LJ Seijbel

13 records found

Defects and morphological changes in nanothin Cu films on Mo(100) studied by thermal helium desorption spectrometry

Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallite size

Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials

Diffraction line broadening analysis of broadening is caused by both dislocations and limited crystallize size

Dislocation studies of thin layers under stress

Size-strain analysis using diffraction-line profiles from tilted specimens

Thin Cu films on Mo analyzed by thermal helium desorption spectrometry

Size-strain analysis using diffraction-line profiles from tilted specimens

Morphology changes in thin Cu films on Mo

Relation between texture and stress in thin sputtered molybdenum layers.

Dislocations in thin metal films observed with X-ray diffraction.
Conference paper (2001) - LJ Seijbel (author), R. Delhez (author)

Relation between macro- and microstress in thin metallic layers.
Conference paper (2000) - LJ Seijbel (author), R. Delhez (author)

Early stages of IBAD-film growth: Differences between (100) and polycrystalline Mo substrates.