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Interaction of deuterium with cavities in crystalline Si and MgO

Conference paper (1999) - AV Fedorov, A van Veen, H. Schut

Annealing behaviour of defects in helium implanted MgO

Journal article (1999) - H. Schut, A van Veen, F. Labohm, AV Fedorov, EAC Neeft, RJM Konings

Influence of heat treatment on Twaron®samples studied by positron annihilation

Report (1999) - R Escobar Galindo, CV Falub, A van Veen, H. Schut

Low energy positron beam doppler broadening studies on SOI materials

Report (1999) - H. Schut, A van Veen

Microstructural investigation of iron nitride layers formed by low-temperature gaseous nitriding.

Journal article (1999) - DK Inia, AM Vredenberg, DO Boerma, F.D. Tichelaar, H. Schut, A van Veen

Nanovoids and metallic nanoprecipitates in MgO

Report (1999) - MA van Huis, AV Fedorov, H. Schut, A van Veen

A testing set-up for a micro-analysis positron beam facility.

Journal article (1999) - LV Jorgensen, AHV van Veen, H. Schut, A.J.M. Winkelman, P. Kruit

Hydrogen implantation defects in MgO

Journal article (1999) - A van Veen, H. Schut, AV Fedorov, EAC Neeft, RJM Konings, BJ Kooi, ThM Hosson

Impact of neutron irradation and helium implantation on ceramic support materials for uranium-free fuels

Conference paper (1998) - EAC Neeft, RJM Konings, A van Veen, H. Schut, AV Fedorov

Afscherming POSH in bundelas R3 van de HOR, V-817

Report (1998) - A.J.J. bos, H. Schut

Two-detector Doppler broadening study of enhancement in Al

Journal article (1998) - P.E. Mijnarends, AC Kruseman, A van Veen, H. Schut, A Bansil

Positron beam analysis of ion implantation defects in silicon and metal oxides

Abstract (1998) - A van Veen, H. Schut, P.E. Mijnarends

The thermal evaluation of nanocavities in helium and deuterium implanted MgO single crystals

Abstract (1998) - EAC Neeft, AV Fedorov, A van Veen, H. Schut, RJM Konings, F. Labohm

Evidence of very low-energy positron reflection of tungsten surfaces

Journal article (1998) - LV Jorgensen, F. Labohm, H. Schut, A van Veen

Characterization of defects at the Si/SiO2 interface of a polysilicon-gated MOS system by monoenergetic positrons

Journal article (1997) - M Clement, JMM de Nijs, H. Schut, A van Veen

Transport of positrons in an electrically biased MOS system

Journal article (1997) - M Clement, JMM de Nijs, H. Schut, A van Veen, P Balk

Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system

Journal article (1997) - AC Kruseman, H. Schut, A van Veen, P.E. Mijnarends, M Clement, JMM de Nijs

Positron annihilation as a tool for the study of defects in the MOS system

Journal article (1997) - JMM de Nijs, M Clement, H. Schut, A van Veen

Positron beam technique for the study of defects at the Si/SiO2 interface of a polysillicon gated MOS system

Conference paper (1997) - M Clement, JMM de Nijs, H. Schut, A van Veen, P Balk

Analysis of positron beam data by combined use of the shape and wing parameters

Journal article (1996) - M Clement, JMM de Nijs, A van Veen, H. Schut, P Balk

H. Schut

Authored