R Durny | TU Delft Repository

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R Durny

Conference paper (3)

Journal article (2)

5 records found

1

Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy

Conference paper (2007) - V Nadazdy (author), V Rana (author), R Ishihara (author), R. Ishihara (author), Ryoichi Ishihara (author), S Lanyi (author), R Durny (author), JW Metselaar (author), C. W J Beenakker (author), C.I.M. Beenakker (author)

Defect states in excimer-laser crystallized single-grain TFTs studied with isothermal charge deep-level transient spectroscopy

Conference paper (2006) - V Nadazdy (author), V Rana (author), R Ishihara (author), R. Ishihara (author), Ryoichi Ishihara (author), S Lanyi (author), R Durny (author), JW Metselaar (author), C. W J Beenakker (author), C.I.M. Beenakker (author)

Defect-state engineering in a-Si:H: An effective tool for studying processes during light-induced degradation

Journal article (2006) - V Nadazdy (author), R Durny (author), Miro Zeman (author), Miroslav Zeman (author), M Zeman (author), M. Zeman (author)

Evolution of chatged gap states in a-Si:H under light exposure

Conference paper (2003) - M Zeman (author), M. Zeman (author), Miro Zeman (author), Miroslav Zeman (author), V Nadazdy (author), R.A.C.M.M. van Swaaij (author), René A.C.M.M. van Swaaij (author), René van Swaaij (author), RACMM van Swaaij (author), Rene van Swaaij (author), R Durny (author), JW Metselaar (author)

Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

Journal article (2002) - V Nadazdy (author), R Durny (author), I Thurzo (author), E Pincik (author), A Nishida (author), J Shimizu (author), M Kumeda (author), T Shimizu (author)