5 records found
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Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy
Defect-state engineering in a-Si:H: An effective tool for studying processes during light-induced degradation
Defect states in excimer-laser crystallized single-grain TFTs studied with isothermal charge deep-level transient spectroscopy
Evolution of chatged gap states in a-Si:H under light exposure
Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon