Defect-state engineering in a-Si:H: An effective tool for studying processes during light-induced degradation

Nadazdy, V; Durny, R; Zeman, Miro

Defect-state engineering in a-Si:H: An effective tool for studying processes during light-induced degradation

Journal article (2006)

Authors

V Nadazdy Electronic Components, Technology and Materials

R Durny External organisation

Miro Zeman Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

To reference this document use:

http://resolver.tudelft.nl/uuid:82612327-9957-4a80-bf72-d66775ed22cb

More Info

expand_more

Published Date

2006

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Electronic Components, Technology and Materials

No files available

Metadata only record. There are no files for this journal article.