Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy

Conference paper (2007)

Authors

V Nadazdy Electronic Components, Technology and Materials - EEMCS
V Rana Electronic Components, Technology and Materials - EEMCS
R Ishihara Electronic Components, Technology and Materials - EEMCS
S Lanyi External organisation
R Durny External organisation
JW Metselaar Electronic Components, Technology and Materials - EEMCS
C. W J Beenakker Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2007

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials