Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy

Nadazdy, V; Rana, V; Ishihara, R; Lanyi, S; Durny, R; Metselaar, JW; Beenakker, C. W J

Defect States in Excimer-Laser Crystallized Single-Grain TFTs Studied with Isothermal Charge Deep-level Transient Spectroscopy

Conference paper (2007)

Authors

V Nadazdy Electronic Components, Technology and Materials

V Rana Electronic Components, Technology and Materials

R Ishihara Electronic Components, Technology and Materials

S Lanyi External organisation

R Durny External organisation

JW Metselaar Electronic Components, Technology and Materials

C. W J Beenakker Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2007

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Research Group

Electronic Components, Technology and Materials

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