Defect states in excimer-laser crystallized single-grain TFTs studied with isothermal charge deep-level transient spectroscopy

Nadazdy, V; Rana, V; Ishihara, R; Lanyi, S; Durny, R; Metselaar, JW; Beenakker, C. W J

Defect states in excimer-laser crystallized single-grain TFTs studied with isothermal charge deep-level transient spectroscopy

Conference paper (2006)

Authors

V Nadazdy Electronic Components, Technology and Materials

V Rana Electronic Components, Technology and Materials

R Ishihara Electronic Components, Technology and Materials

S Lanyi External organisation

R Durny External organisation

JW Metselaar Electronic Components, Technology and Materials

C. W J Beenakker Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

To reference this document use:

http://resolver.tudelft.nl/uuid:f863267d-82a2-41af-8197-a21ae404677d

More Info

expand_more

Published Date

2006

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Research Group

Electronic Components, Technology and Materials

No files available

Metadata only record. There are no files for this conference paper.