8 records found
1
Integration of MOSFETs with SiGe dots as stressor material
X-ray investigation of buried SiGe islands for devices with strain-enhanced mobility
X-ray diffraction study of the composition and strain fields in buried SiGe islands
Three-dimensional isocompositional profiles of buried SiGe/Si(001) islands
Evolution of buried semiconductor nanostructures and origin of stepped surface mounds during capping
Investigating the lateral motion of SiGe islands by selective chemical etching
Reading the footprints of strained islands