Sv

S. van Haver

28 records found

Authored

Image simulations of extended objects using an algorithm based on the Extended Nijboer Zernike (ENZ) formalism

Combining various optical simulations tools to enable complex optical systems simulations.

Characterization of a novel mask imaging algorithm based on the Extended Nijboer-Zernike (ENZ) formalism.

Evaluation of scaled and annular pupils within the framework od the extended Nijboer-Zernike (ENZ) formalism.

Assessment of optical systems by means of point-spread functions.

Zernike representation and Strehl ratio op optical systems with variable numerical aperture.
Journal article (2008) - AJEM Janssen, S. van Haver, P. Dirksen, J.J.M. Braat

General imaging of advanced 3D mask object based on the fully-vectorial extended Nijboer-Zernike (ENZ) theory.

Analytic expressions and approximations for the on-axis, aberration-free Rayleigh and Debye intergral in the case of focusing fields on a circular aperture.

Characterization of a novel mask imaging algorithm based on the Extended Nijboer Zernike (ENZ) formalism.

Extended Nijboer-Zernike (ENZ) based mask imaging: efficient coupling of electromagnetic field solvers and the ENZ imaging algorithm

Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.
Conference paper (2007) - S. van Haver, AJEM Janssen, P. Dirksen, J.J.M. Braat

Strehl ratio and optimum focus of high-numerical-aperture beams.
Journal article (2007) - AJEM Janssen, S. van Haver, J.J.M. Braat, P. Dirksen

Numerical analysis of aslit-groove diffrection problem

Energy and angular momentum flux in a high-numerical-aperture imaging system using the extended Nijboer-Zernike theory.
Journal article (2007) - S. van Haver, J.J.M. Braat, A.J.E.M. Jansen, P. Dirksen

High-NA aberration retrieval with extended Nijboer-Zernike vector diffraction theory: Erratum
Journal article (2007) - S. van Haver, J.J.M. Braat, P. Dirksen, AJEM Janssen

High-NA lens characterization by through-focus intensity measurement
Conference paper (2006) - S. van Haver, J.J.M. Braat, P. Dirksen, AJEM Janssen

Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

High-NA aberration retrieval with the extended Nijboer-Zernike vector diffraction theory.
Journal article (2006) - S. van Haver, J.J.M. Braat, P. Dirksen, AJEM Janssen

Rigorous Mask-imaging using the extended Nijboer-Zernike diffraction theory.

Extended Nijboer-Zernike approach to aberration and birefringence retrieval in a high-numerical-aperture optical system