Characterization of a novel mask imaging algorithm based on the Extended Nijboer-Zernike (ENZ) formalism.

Poster (2008)

Authors

S. van Haver ImPhys/Optics
O.T.A. Janssen ImPhys/Optics
AJEM Janssen External organisation
J.J.M. Braat ImPhys/Optics
Silvania F. Pereira ImPhys/Optics
P Evanschitzky External organisation
Research Group
ImPhys/Optics
More Info
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Published Date

2008

Language

Undefined/Unknown

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Research Group

ImPhys/Optics

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