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MJ Geuzebroek

7 records found

TPI for improving PR fault coverage of Boolean and three-state circuits

Test point insertion to improve BIST performance and to reduce ATPG test time and data volume
Doctoral thesis (2003) - MJ Geuzebroek (author)

Test point insertion that facilitates ATPG in reducing test time and data volume

Logic BIST technology evaluation: an industrial case study
Conference paper (2001) - C Feige (author), MJ Geuzebroek (author)

Facilitating automatic test pattern generators using test point insertion

Test point insertion for compact test sets

Application of Transient Heat Flux Sensors to Resolve Time-Dependent Convective Heat Transfer from Wall-mounted Cubes